A Study of the Impact of Delay Mismatch on Linearity of Outphasing Transmitters

Aref, Ahmed Farouk (Corresponding author); Hone, Thomas M. (Corresponding author); Negra, Renato (Corresponding author)

New York, NY : Institute of Electrical and Electronics Engineers (2014, 2015)
Journal Article

In: IEEE transactions on circuits and systems / 1
Volume: 62
Issue: 1
Page(s)/Article-Nr.: 254-262