Simplified thru-only 4-port de-embedding method

Fan, Chun-Yu (Corresponding author); Wei, Muh-Dey; Negra, Renato

Piscataway, NJ] : IEEE (2017)
Buchbeitrag, Beitrag zu einem Tagungsband

In: 2017 12th European Microwave Integrated Circuits Conference : 9-12 October 2017, Nuremberg, Germany / EuMIC 2017, the 12th European Microwave Integrated Circuits Conference ; co-sponsored by: GAAS, Electron Devices Society
Seite(n)/Artikel-Nr.: 101-104

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