Functional analysis of an integrated communication interface during ESD

Ungru, Thomas (Corresponding author); Wilkening, Wolfgang; Walker, Steffen; Negra, Renato (Corresponding author)

Piscataway, NJ : IEEE (2015)
Buchbeitrag, Beitrag zu einem Tagungsband

In: The 2015 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits : November 10th-13th 2015, Edinburgh, UK / supported by: IEEE, EMC Society, IET - The Institution of Engineering and Technology
Seite(n)/Artikel-Nr.: 125-130

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