A Study of the Impact of Delay Mismatch on Linearity of Outphasing Transmitters

Aref, Ahmed Farouk (Corresponding author); Hone, Thomas M. (Corresponding author); Negra, Renato (Corresponding author)

New York, NY : Institute of Electrical and Electronics Engineers (2014, 2015)

In: IEEE transactions on circuits and systems / 1
Band: 62
Heft: 1
Seite(n)/Artikel-Nr.: 254-262